Rohde & Schwarz E-Line Extreme Temperature Test Chamber 1140-7490-02 / Warranty - $58,500 - (Palisades Park, NJ)
Feel free to contact us for additional information through ebay mail, or directly at: nrscientific@gmail.com or at (201) 592-1864. Rohde & Schwarz E-Line 1140-7490-02 Extreme Temperature Test Chamber P/N: 1140-7490-02; S/N: 100011 This chamber is in very good operational condition, and carries our standard 4-month, no-nonsense warranty. Manual and software are included. This chamber originally cost approximately $100,00.00. For your reference, the seller is N&R Scientific Co., Inc. We have been providing the highest quality refurbished and fully guaranteed equipment worldwide for many years. You can purchase with complete confidence that the equipment will be provided in excellent cosmetic and perfect operational condition. Our facility is located in the metropolitan NYC area. Please note: for purchases of this size, we are unable to accept credit cards or PayPal unless special arrangements are made. Kindly contact us regarding suitable payment arrangements. Temperature Range: -40°C to +80°C Normal 0 Manufacturer's Description: The Extreme Temperature Tester E-Line is a measurement environment for wireless RF devices (e.g. mobile phones, Bluetooth devices, and remote keyless entry systems). The E-Line combines a shielded environment with a temperature-controlled chamber. Used as a test sequencer, the TSVP allows several devices to be measured in the same test run. The E-Line is software-controlled and handles all communication with the measurement system. Hardware: The E-Line provides a shielded and climatic environment. The system is approx. 2 m high and has the width of a 19'' rack. The E-Line also allows 19'' devices to be integrated. The system comes with a panel for taking up the DUTs. The panel can be provided according to the customer's specifications. The DUTs are connected via special fixtures, which are mounted on the DUT panel. The number of DUTs measured in the E-Line depends on the size of each individual DUT. Feature: Test of different DUTs and/or…
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